Wafer probe


Qitai Semiconductor has the CP (circuit probe) testing service capability for 6-12 inch wafers, providing customized CP testing support for complex large-scale SoC chips, RF and communication chips, analog and mixed signal chips and other chip product wafers.

Product features:

  • Wafer testing: 12 inch, 8 inch, 6 inch wafer testing;
  •  Trial scope: including advanced processes such as 17nm, 22nm, 28nm, and all mature processes of wafers above 28nm;
  • Test business process: requirement mining → service module construction → service scheme design → scheme implementation and feedback → service delivery completion;
  • Testing process flow: Evaluation of testing plan → Outsourcing of needle cards → LB production → Development of testing program → Machine debugging → Data confirmation → Mass production → Providing customer testing reports and data → Shipment.
Scroll to Top